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2 Publikationen
2001 | Artikel | FH-PUB-ID: 2683
Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe
J. Schleiwies, G. Schmitz, S. Heitmann, A. Hütten, Applied Physics Letters 78 (2001) 3439–3441.
HSBI-PUB
| DOI
J. Schleiwies, G. Schmitz, S. Heitmann, A. Hütten, Applied Physics Letters 78 (2001) 3439–3441.
1996 | Artikel | FH-PUB-ID: 1456
Analysis of reverse current–voltage characteristics of Ti/6H–SiC Schottky diodes
C. Schröder, W. Heiland, R. Held, W. Loose, Applied Physics Letters 68 (1996) 1957–1959.
HSBI-PUB
| DOI
C. Schröder, W. Heiland, R. Held, W. Loose, Applied Physics Letters 68 (1996) 1957–1959.