Prof. Dr. rer. nat. Frank Hamelmann

Publikationen

J. A. Weicht
Simulation and test of metastability of a-Si/µc-Si solar modules under outdoor conditions
Berichte aus der Physik, Shaker Verlag, Aachen, ISBN: 978-3-8440-5224-4, 2017

G. Behrens, J. A. Weicht, K. Schlender, F. Fehring, R. Dreimann, M. Meese, F. U. Hamelmann, C. Thiel, T. Försterling, M. Wübbenhorst
Smart Monitoring System of Air Quality and Wall Humidity Accompanying an Energy Efficient Renovation
Process of Apartment Buildings, In From Science to Society (pp. 181-189), Springer, Cham., DOI: 10.1007/978-3-319-65687-8_16, 2017

J. A. Weicht, G. Behrens, F. U. Hamelmann
Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells
Proc. EU PVSEC 32, 2016.

A. Weicht, G. Behrens, F. U. Hamelmann
Performance of thin-film-silicon based solar modules under clouded and clear sky conditions in comparison to crystalline silicon modules
Electronic Materials Letters, 2016

F. U. Hamelmann, J. A. Weicht, G. Behrens
Light-Induced Degradation of Thin Film Silicon Solar Cells
Journal of Physics: Conference Serie, 682(1): 12002, DOI: 10.1088/1742- 6596/682/1/01200, 2016

J. A. Weicht, G. Behrens, F. U. Hamelmann
Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit
Journal of Physics: Conference Serie, 682(1): 12/7, DOI: 10.1088/1742-6596/682/1/012017, 2016

F. U. Hamelmann
Thin film zinc oxide deposited by CVD and PVD
Journal of Physics: Conference Series. 764(1), 12001, 2016.

J. A. Weicht, G. Behrens, F. U. Hamelmann
Changing in irradiation behavior and temperature-coefficient variation caused by light-induced degradation of a-Si/μc-Si solar cells
Proc. IEEE PVSC 42, 2015

A. N. Corpus-Mendoza, M. M. De Souza, F. Hamelmann
Separation of bulk and contact interface degradation in thin film silicon solar cells
Journal of Renewable and Sustainable Energy 7(6), DOI: 10.1063/1.4936592 , 063115, 2015

J. A. Weicht, R. Rasch, G. Behrens, F. U. Hamelmann
Changing of the parameters of the ”three-diode model” by light-induced degradation at different degradation temperatures of a-Si/μc-Si solar cells
Proc. EU PVSEC 31, 2015

R. Rasch, G. Behrens, F. U. Hamelmann, S. Hantelmann, R. Dreimann, J. A. Weicht
Automated Thermal Imaging for Fault Detection on PV-Systems
Proc. EU PVSEC 31, 2015

J. A. Weicht, F. U. Hamelmann, G. Behrens
Parameter variation of the one-diode model of a-Si and a-Si/mu c-Si solar cells for modeling light-induced degradation
Journal of Physics: Conference Series, IOP Publishing, 559: 12/7, DOI: 10.1088/1742-6596/559/1/012017, 2014