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1 Publikation
2016 | Konferenzbeitrag | FH-PUB-ID: 175
Weicht, Johannes, Frank Hamelmann, and Grit Behrens. “Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells,” 2016. https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4.
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