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1 Publikation
2016 | Konferenzbeitrag | FH-PUB-ID: 175
Weicht, J., Hamelmann, F., & Behrens, G. (2016). Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells. Presented at the 32nd European Photovoltaic Solar Energy Conference and Exhibition, München. https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4
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