Pub Hochschule Bielefeld

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2 Publikationen

2001 | Artikel | FH-PUB-ID: 2683

J. Schleiwies, G. Schmitz, S. Heitmann, and A. Hütten, “Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe,” Applied Physics Letters, vol. 78, no. 22, pp. 3439–3441, 2001.

HSBI-PUB | DOI

1996 | Artikel | FH-PUB-ID: 1456

C. Schröder, W. Heiland, R. Held, and W. Loose, “Analysis of reverse current–voltage characteristics of Ti/6H–SiC Schottky diodes,” Applied Physics Letters, vol. 68, no. 14, pp. 1957–1959, 1996.

HSBI-PUB | DOI