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2 Publikationen
2001 | Artikel | FH-PUB-ID: 2683
Schleiwies, J., G. Schmitz, Sonja Heitmann, and A. Hütten. “Nanoanalysis of Co/Cu/NiFe Thin Films by Tomographic Atom Probe.” Applied Physics Letters 78, no. 22 (2001): 3439–41. https://doi.org/10.1063/1.1374999.
HSBI-PUB
| DOI
1996 | Artikel | FH-PUB-ID: 1456
Schröder, Christian, W. Heiland, R. Held, and W. Loose. “Analysis of Reverse Current–Voltage Characteristics of Ti/6H–SiC Schottky Diodes.” Applied Physics Letters 68, no. 14 (1996): 1957–59. https://doi.org/10.1063/1.115638.
HSBI-PUB
| DOI