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2 Publikationen
2001 | Artikel | FH-PUB-ID: 2683
Schleiwies, J., Schmitz, G., Heitmann, S., & Hütten, A. (2001). Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe. Applied Physics Letters, 78(22), 3439–3441. https://doi.org/10.1063/1.1374999
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| DOI
1996 | Artikel | FH-PUB-ID: 1456
Schröder, C., Heiland, W., Held, R., & Loose, W. (1996). Analysis of reverse current–voltage characteristics of Ti/6H–SiC Schottky diodes. Applied Physics Letters, 68(14), 1957–1959. https://doi.org/10.1063/1.115638
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| DOI