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2 Publikationen
2001 | Artikel | FH-PUB-ID: 2683
Schleiwies J, Schmitz G, Heitmann S, Hütten A. Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe. Applied Physics Letters. 2001;78(22):3439-3441. doi:10.1063/1.1374999
HSBI-PUB
| DOI
1996 | Artikel | FH-PUB-ID: 1456
Schröder C, Heiland W, Held R, Loose W. Analysis of reverse current–voltage characteristics of Ti/6H–SiC Schottky diodes. Applied Physics Letters. 1996;68(14):1957-1959. doi:10.1063/1.115638
HSBI-PUB
| DOI