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1 Publikation
2024 | Artikel | FH-PUB-ID: 4571 | 
Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra
M. Wortmann, K. Viertel, M. Westphal, D. Graulich, Y. Yang, M. Gärner, J. Schmalhorst, N. Frese, T. Kuschel, Small Methods 8 (2024).
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M. Wortmann, K. Viertel, M. Westphal, D. Graulich, Y. Yang, M. Gärner, J. Schmalhorst, N. Frese, T. Kuschel, Small Methods 8 (2024).