Pub Hochschule Bielefeld

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2 Publikationen

2001 | Artikel | FH-PUB-ID: 2683

Schleiwies, J. ; Schmitz, G. ; Heitmann, Sonja ; Hütten, A.: Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe. In: Applied Physics Letters Bd. 78, AIP Publishing (2001), Nr. 22, S. 3439–3441

HSBI-PUB | DOI

1996 | Artikel | FH-PUB-ID: 1456

Schröder, Christian ; Heiland, W. ; Held, R. ; Loose, W.: Analysis of reverse current–voltage characteristics of Ti/6H–SiC Schottky diodes. In: Applied Physics Letters Bd. 68, AIP Publishing (1996), Nr. 14, S. 1957–1959

HSBI-PUB | DOI