{"_id":"3699","status":"public","date_created":"2023-11-09T14:20:12Z","publication":"2023 International Symposium on Electromagnetic Compatibility – EMC Europe","title":"Discussion of the height scan introduced in CISPR 32 for measuring emissions above 1 GHz","citation":{"bibtex":"@inproceedings{Battermann_Hemmerlein_Stecher_2023, title={Discussion of the height scan introduced in CISPR 32 for measuring emissions above 1 GHz}, DOI={<a href=\"https://doi.org/10.1109/EMCEurope57790.2023.10274182\">10.1109/EMCEurope57790.2023.10274182</a>}, booktitle={2023 International Symposium on Electromagnetic Compatibility – EMC Europe}, publisher={IEEE}, author={Battermann, Sven and Hemmerlein, Kurt and Stecher, Manfred}, year={2023}, pages={1–6} }","ama":"Battermann S, Hemmerlein K, Stecher M. Discussion of the height scan introduced in CISPR 32 for measuring emissions above 1 GHz. In: <i>2023 International Symposium on Electromagnetic Compatibility – EMC Europe</i>. IEEE; 2023:1-6. doi:<a href=\"https://doi.org/10.1109/EMCEurope57790.2023.10274182\">10.1109/EMCEurope57790.2023.10274182</a>","mla":"Battermann, Sven, et al. “Discussion of the Height Scan Introduced in CISPR 32 for Measuring Emissions above 1 GHz.” <i>2023 International Symposium on Electromagnetic Compatibility – EMC Europe</i>, IEEE, 2023, pp. 1–6, doi:<a href=\"https://doi.org/10.1109/EMCEurope57790.2023.10274182\">10.1109/EMCEurope57790.2023.10274182</a>.","ieee":"S. Battermann, K. Hemmerlein, and M. Stecher, “Discussion of the height scan introduced in CISPR 32 for measuring emissions above 1 GHz,” in <i>2023 International Symposium on Electromagnetic Compatibility – EMC Europe</i>, Krakow, Poland, 2023, pp. 1–6.","apa":"Battermann, S., Hemmerlein, K., &#38; Stecher, M. (2023). Discussion of the height scan introduced in CISPR 32 for measuring emissions above 1 GHz. In <i>2023 International Symposium on Electromagnetic Compatibility – EMC Europe</i> (pp. 1–6). Krakow, Poland: IEEE. <a href=\"https://doi.org/10.1109/EMCEurope57790.2023.10274182\">https://doi.org/10.1109/EMCEurope57790.2023.10274182</a>","chicago":"Battermann, Sven, Kurt Hemmerlein, and Manfred Stecher. “Discussion of the Height Scan Introduced in CISPR 32 for Measuring Emissions above 1 GHz.” In <i>2023 International Symposium on Electromagnetic Compatibility – EMC Europe</i>, 1–6. IEEE, 2023. <a href=\"https://doi.org/10.1109/EMCEurope57790.2023.10274182\">https://doi.org/10.1109/EMCEurope57790.2023.10274182</a>.","short":"S. Battermann, K. Hemmerlein, M. Stecher, in: 2023 International Symposium on Electromagnetic Compatibility – EMC Europe, IEEE, 2023, pp. 1–6.","alphadin":"<span style=\"font-variant:small-caps;\">Battermann, Sven</span> ; <span style=\"font-variant:small-caps;\">Hemmerlein, Kurt</span> ; <span style=\"font-variant:small-caps;\">Stecher, Manfred</span>: Discussion of the height scan introduced in CISPR 32 for measuring emissions above 1 GHz. In: <i>2023 International Symposium on Electromagnetic Compatibility – EMC Europe</i> : IEEE, 2023, S. 1–6"},"user_id":"216459","publication_status":"published","year":"2023","page":"1-6","department":[{"_id":"102"}],"date_updated":"2023-11-10T12:59:29Z","language":[{"iso":"eng"}],"type":"conference","publication_identifier":{"eisbn":["979-8-3503-2400-6"]},"abstract":[{"text":"This paper discusses the introduction of the antenna height scan in CISPR 32 Ed. 2.1 from technical and economical point of view. An artificial equipment under test (EUT) has been examined in an absorber-lined semi-anechoic chamber and a fully anechoic room. The influence of insufficient floor absorber layout and antenna tilting on the height scan is presented by measurements and calculations. The paper closes with a description of the relation between the measurement method, the measurand and the definition of limits with respect to the disturbance scenario (CISPR 16-4-4) and the challenges of EMC measurements with modern electric systems.","lang":"eng"}],"conference":{"name":"2023 International Symposium on Electromagnetic Compatibility – EMC Europe","location":"Krakow, Poland","start_date":"2023-09-04","end_date":"2023-09-08"},"doi":"10.1109/EMCEurope57790.2023.10274182","quality_controlled":"1","publisher":"IEEE","author":[{"first_name":"Sven","orcid":"0000-0001-7203-7396","id":"219522","full_name":"Battermann, Sven","last_name":"Battermann"},{"last_name":"Hemmerlein","full_name":"Hemmerlein, Kurt","first_name":"Kurt"},{"first_name":"Manfred","last_name":"Stecher","full_name":"Stecher, Manfred"}]}