Discussion of the height scan introduced in CISPR 32 for measuring emissions above 1 GHz
S. Battermann, K. Hemmerlein, M. Stecher, in: 2023 International Symposium on Electromagnetic Compatibility – EMC Europe, IEEE, 2023, pp. 1–6.
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Konferenzbeitrag
| Veröffentlicht
| Englisch
Autor*in
Battermann, Sven
;
Hemmerlein, Kurt;
Stecher, Manfred
;
Hemmerlein, Kurt;
Stecher, ManfredEinrichtung
Abstract
This paper discusses the introduction of the antenna height scan in CISPR 32 Ed. 2.1 from technical and economical point of view. An artificial equipment under test (EUT) has been examined in an absorber-lined semi-anechoic chamber and a fully anechoic room. The influence of insufficient floor absorber layout and antenna tilting on the height scan is presented by measurements and calculations. The paper closes with a description of the relation between the measurement method, the measurand and the definition of limits with respect to the disturbance scenario (CISPR 16-4-4) and the challenges of EMC measurements with modern electric systems.
Erscheinungsjahr
Titel des Konferenzbandes
2023 International Symposium on Electromagnetic Compatibility – EMC Europe
Seite
1-6
Konferenz
2023 International Symposium on Electromagnetic Compatibility – EMC Europe
Konferenzort
Krakow, Poland
Konferenzdatum
2023-09-04 – 2023-09-08
FH-PUB-ID
Zitieren
Battermann, Sven ; Hemmerlein, Kurt ; Stecher, Manfred: Discussion of the height scan introduced in CISPR 32 for measuring emissions above 1 GHz. In: 2023 International Symposium on Electromagnetic Compatibility – EMC Europe : IEEE, 2023, S. 1–6
Battermann S, Hemmerlein K, Stecher M. Discussion of the height scan introduced in CISPR 32 for measuring emissions above 1 GHz. In: 2023 International Symposium on Electromagnetic Compatibility – EMC Europe. IEEE; 2023:1-6. doi:10.1109/EMCEurope57790.2023.10274182
Battermann, S., Hemmerlein, K., & Stecher, M. (2023). Discussion of the height scan introduced in CISPR 32 for measuring emissions above 1 GHz. In 2023 International Symposium on Electromagnetic Compatibility – EMC Europe (pp. 1–6). Krakow, Poland: IEEE. https://doi.org/10.1109/EMCEurope57790.2023.10274182
@inproceedings{Battermann_Hemmerlein_Stecher_2023, title={Discussion of the height scan introduced in CISPR 32 for measuring emissions above 1 GHz}, DOI={10.1109/EMCEurope57790.2023.10274182}, booktitle={2023 International Symposium on Electromagnetic Compatibility – EMC Europe}, publisher={IEEE}, author={Battermann, Sven and Hemmerlein, Kurt and Stecher, Manfred}, year={2023}, pages={1–6} }
Battermann, Sven, Kurt Hemmerlein, and Manfred Stecher. “Discussion of the Height Scan Introduced in CISPR 32 for Measuring Emissions above 1 GHz.” In 2023 International Symposium on Electromagnetic Compatibility – EMC Europe, 1–6. IEEE, 2023. https://doi.org/10.1109/EMCEurope57790.2023.10274182.
S. Battermann, K. Hemmerlein, and M. Stecher, “Discussion of the height scan introduced in CISPR 32 for measuring emissions above 1 GHz,” in 2023 International Symposium on Electromagnetic Compatibility – EMC Europe, Krakow, Poland, 2023, pp. 1–6.
Battermann, Sven, et al. “Discussion of the Height Scan Introduced in CISPR 32 for Measuring Emissions above 1 GHz.” 2023 International Symposium on Electromagnetic Compatibility – EMC Europe, IEEE, 2023, pp. 1–6, doi:10.1109/EMCEurope57790.2023.10274182.
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