{"user_id":"245590","page":"1384-1388","publication_identifier":{"eisbn":["978-1-4799-4398-2","978-1-4799-4399-9"]},"publication":"2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)","date_updated":"2023-09-05T13:04:41Z","date_created":"2023-09-01T12:12:29Z","conference":{"location":"Denver, CO, USA","name":"2014 IEEE 40th Photovoltaic Specialists Conference (PVSC)"},"author":[{"full_name":"Weicht, J. A.","last_name":"Weicht","first_name":"J. A."},{"first_name":"Frank","id":"208487","full_name":"Hamelmann, Frank","last_name":"Hamelmann"},{"first_name":"A.","full_name":"Domnik, A.","last_name":"Domnik"},{"last_name":"Behrens","full_name":"Behrens, G.","first_name":"G."}],"doi":"10.1109/PVSC.2014.6925176","publisher":"IEEE","title":"Changes in the serial resistance Of a- Si, a-/&#x03BC;c-Si and mono-crystalline PV modules during the year","publication_status":"published","type":"conference","year":"2014","citation":{"ieee":"J. A. Weicht, F. Hamelmann, A. Domnik, and G. Behrens, “Changes in the serial resistance Of a- Si, a-/&#38;#x03BC;c-Si and mono-crystalline PV modules during the year,” in <i>2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)</i>, Denver, CO, USA, 2014, pp. 1384–1388.","ama":"Weicht JA, Hamelmann F, Domnik A, Behrens G. Changes in the serial resistance Of a- Si, a-/&#38;#x03BC;c-Si and mono-crystalline PV modules during the year. In: <i>2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)</i>. IEEE; 2014:1384-1388. doi:<a href=\"https://doi.org/10.1109/PVSC.2014.6925176\">10.1109/PVSC.2014.6925176</a>","apa":"Weicht, J. A., Hamelmann, F., Domnik, A., &#38; Behrens, G. (2014). Changes in the serial resistance Of a- Si, a-/&#38;#x03BC;c-Si and mono-crystalline PV modules during the year. In <i>2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)</i> (pp. 1384–1388). Denver, CO, USA: IEEE. <a href=\"https://doi.org/10.1109/PVSC.2014.6925176\">https://doi.org/10.1109/PVSC.2014.6925176</a>","short":"J.A. Weicht, F. Hamelmann, A. Domnik, G. Behrens, in: 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), IEEE, 2014, pp. 1384–1388.","mla":"Weicht, J. A., et al. “Changes in the Serial Resistance Of A- Si, a-/&#38;#x03BC;c-Si and Mono-Crystalline PV Modules during the Year.” <i>2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)</i>, IEEE, 2014, pp. 1384–88, doi:<a href=\"https://doi.org/10.1109/PVSC.2014.6925176\">10.1109/PVSC.2014.6925176</a>.","bibtex":"@inproceedings{Weicht_Hamelmann_Domnik_Behrens_2014, title={Changes in the serial resistance Of a- Si, a-/&#38;#x03BC;c-Si and mono-crystalline PV modules during the year}, DOI={<a href=\"https://doi.org/10.1109/PVSC.2014.6925176\">10.1109/PVSC.2014.6925176</a>}, booktitle={2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)}, publisher={IEEE}, author={Weicht, J. A. and Hamelmann, Frank and Domnik, A. and Behrens, G.}, year={2014}, pages={1384–1388} }","chicago":"Weicht, J. A., Frank Hamelmann, A. Domnik, and G. Behrens. “Changes in the Serial Resistance Of A- Si, a-/&#38;#x03BC;c-Si and Mono-Crystalline PV Modules during the Year.” In <i>2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)</i>, 1384–88. IEEE, 2014. <a href=\"https://doi.org/10.1109/PVSC.2014.6925176\">https://doi.org/10.1109/PVSC.2014.6925176</a>.","alphadin":"<span style=\"font-variant:small-caps;\">Weicht, J. A.</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Domnik, A.</span> ; <span style=\"font-variant:small-caps;\">Behrens, G.</span>: Changes in the serial resistance Of a- Si, a-/&#38;#x03BC;c-Si and mono-crystalline PV modules during the year. In: <i>2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)</i> : IEEE, 2014, S. 1384–1388"},"status":"public","_id":"3565","abstract":[{"lang":"eng","text":"The changes in the serial resistance Rs of amorphous (a- Si) and amorphous/microcrystalline (a-/μc-Si) tandem silicon-based solar cells is a criterion to analyze the process of light -induced degradation and thermal healing of defects described by the Staebler - Wronski effect. Measurements under laboratory conditions show that the serial resistance increases during the light-induced degradation. Our annual measurement of a- Si, a-/μc-Si and mono-crystalline (c-Si) solar cells under field test conditions will verify this and it will improve the possibility of predicting the behavior of thin-film silicon photovoltaic cells. For a year, the complete current-voltage curve was measured every minute, recorded and analyzed. This data has been transferred into the equivalent circuit diagram for solar cells."}],"language":[{"iso":"eng"}]}