Changes in the serial resistance Of a- Si, a-/μc-Si and mono-crystalline PV modules during the year
J.A. Weicht, F. Hamelmann, A. Domnik, G. Behrens, in: 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), IEEE, 2014, pp. 1384–1388.
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Konferenzbeitrag
| Veröffentlicht
| Englisch
Autor*in
Weicht, J. A.;
Hamelmann, Frank
;
Domnik, A.;
Behrens, G.
;
Domnik, A.;
Behrens, G.Abstract
The changes in the serial resistance Rs of amorphous (a- Si) and amorphous/microcrystalline (a-/μc-Si) tandem silicon-based solar cells is a criterion to analyze the process of light -induced degradation and thermal healing of defects described by the Staebler - Wronski effect. Measurements under laboratory conditions show that the serial resistance increases during the light-induced degradation. Our annual measurement of a- Si, a-/μc-Si and mono-crystalline (c-Si) solar cells under field test conditions will verify this and it will improve the possibility of predicting the behavior of thin-film silicon photovoltaic cells. For a year, the complete current-voltage curve was measured every minute, recorded and analyzed. This data has been transferred into the equivalent circuit diagram for solar cells.
Erscheinungsjahr
Titel des Konferenzbandes
2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
Seite
1384-1388
Konferenz
2014 IEEE 40th Photovoltaic Specialists Conference (PVSC)
Konferenzort
Denver, CO, USA
FH-PUB-ID
Zitieren
Weicht, J. A. ; Hamelmann, Frank ; Domnik, A. ; Behrens, G.: Changes in the serial resistance Of a- Si, a-/μc-Si and mono-crystalline PV modules during the year. In: 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) : IEEE, 2014, S. 1384–1388
Weicht JA, Hamelmann F, Domnik A, Behrens G. Changes in the serial resistance Of a- Si, a-/μc-Si and mono-crystalline PV modules during the year. In: 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC). IEEE; 2014:1384-1388. doi:10.1109/PVSC.2014.6925176
Weicht, J. A., Hamelmann, F., Domnik, A., & Behrens, G. (2014). Changes in the serial resistance Of a- Si, a-/μc-Si and mono-crystalline PV modules during the year. In 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) (pp. 1384–1388). Denver, CO, USA: IEEE. https://doi.org/10.1109/PVSC.2014.6925176
@inproceedings{Weicht_Hamelmann_Domnik_Behrens_2014, title={Changes in the serial resistance Of a- Si, a-/μc-Si and mono-crystalline PV modules during the year}, DOI={10.1109/PVSC.2014.6925176}, booktitle={2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)}, publisher={IEEE}, author={Weicht, J. A. and Hamelmann, Frank and Domnik, A. and Behrens, G.}, year={2014}, pages={1384–1388} }
Weicht, J. A., Frank Hamelmann, A. Domnik, and G. Behrens. “Changes in the Serial Resistance Of A- Si, a-/μc-Si and Mono-Crystalline PV Modules during the Year.” In 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), 1384–88. IEEE, 2014. https://doi.org/10.1109/PVSC.2014.6925176.
J. A. Weicht, F. Hamelmann, A. Domnik, and G. Behrens, “Changes in the serial resistance Of a- Si, a-/μc-Si and mono-crystalline PV modules during the year,” in 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), Denver, CO, USA, 2014, pp. 1384–1388.
Weicht, J. A., et al. “Changes in the Serial Resistance Of A- Si, a-/μc-Si and Mono-Crystalline PV Modules during the Year.” 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), IEEE, 2014, pp. 1384–88, doi:10.1109/PVSC.2014.6925176.
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