{"year":"1999","publication_status":"published","status":"public","_id":"3555","citation":{"bibtex":"@article{Kleineberg_Menke_Hamelmann_Heinzmann_Schmidt_Fecher_Schoenhense_1999, title={Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY}, volume={101–103}, DOI={<a href=\"https://doi.org/10.1016/S0368-2048(98)00374-0\">10.1016/S0368-2048(98)00374-0</a>}, journal={Journal of Electron Spectroscopy and Related Phenomena}, publisher={Elsevier BV}, author={Kleineberg, U and Menke, D and Hamelmann, Frank and Heinzmann, U and Schmidt, O and Fecher, G.H and Schoenhense, G}, year={1999}, pages={931–936} }","ama":"Kleineberg U, Menke D, Hamelmann F, et al. Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY. <i>Journal of Electron Spectroscopy and Related Phenomena</i>. 1999;101-103:931-936. doi:<a href=\"https://doi.org/10.1016/S0368-2048(98)00374-0\">10.1016/S0368-2048(98)00374-0</a>","mla":"Kleineberg, U., et al. “Photoemission Microscopy with Microspot-XPS by Use of Undulator Radiation and a High-Throughput Multilayer Monochromator at BESSY.” <i>Journal of Electron Spectroscopy and Related Phenomena</i>, vol. 101–103, Elsevier BV, 1999, pp. 931–36, doi:<a href=\"https://doi.org/10.1016/S0368-2048(98)00374-0\">10.1016/S0368-2048(98)00374-0</a>.","short":"U. Kleineberg, D. Menke, F. Hamelmann, U. Heinzmann, O. Schmidt, G.. Fecher, G. Schoenhense, Journal of Electron Spectroscopy and Related Phenomena 101–103 (1999) 931–936.","alphadin":"<span style=\"font-variant:small-caps;\">Kleineberg, U</span> ; <span style=\"font-variant:small-caps;\">Menke, D</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Heinzmann, U</span> ; <span style=\"font-variant:small-caps;\">Schmidt, O</span> ; <span style=\"font-variant:small-caps;\">Fecher, G.H</span> ; <span style=\"font-variant:small-caps;\">Schoenhense, G</span>: Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY. In: <i>Journal of Electron Spectroscopy and Related Phenomena</i> Bd. 101–103, Elsevier BV (1999), S. 931–936","apa":"Kleineberg, U., Menke, D., Hamelmann, F., Heinzmann, U., Schmidt, O., Fecher, G. ., &#38; Schoenhense, G. (1999). Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY. <i>Journal of Electron Spectroscopy and Related Phenomena</i>, <i>101</i>–<i>103</i>, 931–936. <a href=\"https://doi.org/10.1016/S0368-2048(98)00374-0\">https://doi.org/10.1016/S0368-2048(98)00374-0</a>","chicago":"Kleineberg, U, D Menke, Frank Hamelmann, U Heinzmann, O Schmidt, G.H Fecher, and G Schoenhense. “Photoemission Microscopy with Microspot-XPS by Use of Undulator Radiation and a High-Throughput Multilayer Monochromator at BESSY.” <i>Journal of Electron Spectroscopy and Related Phenomena</i> 101–103 (1999): 931–36. <a href=\"https://doi.org/10.1016/S0368-2048(98)00374-0\">https://doi.org/10.1016/S0368-2048(98)00374-0</a>.","ieee":"U. Kleineberg <i>et al.</i>, “Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY,” <i>Journal of Electron Spectroscopy and Related Phenomena</i>, vol. 101–103, pp. 931–936, 1999."},"user_id":"216459","publication":"Journal of Electron Spectroscopy and Related Phenomena","title":"Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY","date_created":"2023-09-01T10:07:44Z","doi":"10.1016/S0368-2048(98)00374-0","volume":"101-103","author":[{"full_name":"Kleineberg, U","last_name":"Kleineberg","first_name":"U"},{"last_name":"Menke","full_name":"Menke, D","first_name":"D"},{"id":"208487","first_name":"Frank","last_name":"Hamelmann","full_name":"Hamelmann, Frank"},{"last_name":"Heinzmann","full_name":"Heinzmann, U","first_name":"U"},{"full_name":"Schmidt, O","last_name":"Schmidt","first_name":"O"},{"first_name":"G.H","last_name":"Fecher","full_name":"Fecher, G.H"},{"full_name":"Schoenhense, G","last_name":"Schoenhense","first_name":"G"}],"publisher":"Elsevier BV","language":[{"iso":"eng"}],"page":"931-936","date_updated":"2023-09-01T10:19:09Z","publication_identifier":{"issn":["03682048"]},"type":"journal_article"}