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Evaluation of Textured TCOs for a-Si:H/µc-Si:H Thin Film Solar Cells by Angular Resolved Light Scattering Measurements

W. Dewald, V. Sittinger, B. Szyszka, D. Wippler, J. Hüpkes, P. Obermeyer, F. Hamelmann, H. Stiebig, F. Säuberlich, D. Severin, M. Rohde, U. Schmidt, in: WIP, 2011.

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Konferenzbeitrag | Veröffentlicht | Englisch
Autor*in
Dewald, W.; Sittinger, V.; Szyszka, B.; Wippler, D.; Hüpkes, J.; Obermeyer, P.; Hamelmann, FrankFH Bielefeld; Stiebig, H.; Säuberlich, F.; Severin, D.; Rohde, M.; Schmidt, U.
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Abstract
Transparent conductive oxides (TCO) are often used as transparent front electrodes for thin film solar cells. Besides their conductivity and transparency in the absorption range of the solar cell also the light scattering ability is important for light management. The TCOs are textured, e.g. as grown LPCVD ZnO:B or texture-etched ZnO:Al, and depending on their morphology they are differently adequate for their application as front electrode in solar cells. An evaluation method based on angular resolved light scattering (ARS) is presented in this paper. Measurement results and evaluation of different types of textured doped TCOs like reactively MF sputtered ZnO:Al (Zn:Al target), RF sputtered ZnO:Al (ZnO:Al2O3 target) and LPCVD ZnO:B are shown. A correlation between ARS and short-circuit density of a-Si:H/μc-Si:H p-i-n solar cells was found for LPCVD ZnO:B and reactively or RF sputtered and etched ZnO:Al until a saturation current was reached.
Erscheinungsjahr
Konferenz
European Photovoltaic Solar Energy Conference and Exhibition
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Dewald, W. ; Sittinger, V. ; Szyszka, B. ; Wippler, D. ; Hüpkes, J. ; Obermeyer, P. ; Hamelmann, Frank ; Stiebig, H. ; u. a.: Evaluation of Textured TCOs for a-Si:H/µc-Si:H Thin Film Solar Cells by Angular Resolved Light Scattering Measurements. In:  : WIP, 2011
Dewald W, Sittinger V, Szyszka B, et al. Evaluation of Textured TCOs for a-Si:H/µc-Si:H Thin Film Solar Cells by Angular Resolved Light Scattering Measurements. In: WIP; 2011. doi:10.4229/26THEUPVSEC2011-3AV.2.43
Dewald, W., Sittinger, V., Szyszka, B., Wippler, D., Hüpkes, J., Obermeyer, P., … Schmidt, U. (2011). Evaluation of Textured TCOs for a-Si:H/µc-Si:H Thin Film Solar Cells by Angular Resolved Light Scattering Measurements. Presented at the European Photovoltaic Solar Energy Conference and Exhibition, WIP. https://doi.org/10.4229/26THEUPVSEC2011-3AV.2.43
@inproceedings{Dewald_Sittinger_Szyszka_Wippler_Hüpkes_Obermeyer_Hamelmann_Stiebig_Säuberlich_Severin_et al._2011, title={Evaluation of Textured TCOs for a-Si:H/µc-Si:H Thin Film Solar Cells by Angular Resolved Light Scattering Measurements}, DOI={10.4229/26THEUPVSEC2011-3AV.2.43}, publisher={WIP}, author={Dewald, W. and Sittinger, V. and Szyszka, B. and Wippler, D. and Hüpkes, J. and Obermeyer, P. and Hamelmann, Frank and Stiebig, H. and Säuberlich, F. and Severin, D. and et al.}, year={2011} }
Dewald, W., V. Sittinger, B. Szyszka, D. Wippler, J. Hüpkes, P. Obermeyer, Frank Hamelmann, et al. “Evaluation of Textured TCOs for A-Si:H/Μc-Si:H Thin Film Solar Cells by Angular Resolved Light Scattering Measurements.” WIP, 2011. https://doi.org/10.4229/26THEUPVSEC2011-3AV.2.43.
W. Dewald et al., “Evaluation of Textured TCOs for a-Si:H/µc-Si:H Thin Film Solar Cells by Angular Resolved Light Scattering Measurements,” presented at the European Photovoltaic Solar Energy Conference and Exhibition, 2011.
Dewald, W., et al. Evaluation of Textured TCOs for A-Si:H/Μc-Si:H Thin Film Solar Cells by Angular Resolved Light Scattering Measurements. WIP, 2011, doi:10.4229/26THEUPVSEC2011-3AV.2.43.

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