{"date_updated":"2024-03-28T09:04:58Z","date_created":"2023-09-01T08:51:36Z","user_id":"237837","author":[{"first_name":"J.A.","last_name":"Weicht","full_name":"Weicht, J.A."},{"id":"221232","first_name":"Robin","last_name":"Rasch","full_name":"Rasch, Robin"},{"id":"207629","first_name":"Grit","orcid":"0009-0009-0247-8204","last_name":"Behrens","full_name":"Behrens, Grit"},{"last_name":"Hamelmann","full_name":"Hamelmann, Frank","first_name":"Frank","id":"208487"}],"doi":"10.4229/EUPVSEC20152015-3CV.1.12","publisher":"WIP","conference":{"name":"European Photovoltaic Solar Energy Conference and Exhibition"},"status":"public","_id":"3518","citation":{"ieee":"J. A. Weicht, R. Rasch, G. Behrens, and F. Hamelmann, “Changing of the Parameters of the ‘three-Diode Model’ by Light-Induced Degradation at Different Degradation Temperatures of a-Si/µc-Si Solar Cells,” presented at the European Photovoltaic Solar Energy Conference and Exhibition, 2015.","apa":"Weicht, J. A., Rasch, R., Behrens, G., &#38; Hamelmann, F. (2015). Changing of the Parameters of the “three-Diode Model” by Light-Induced Degradation at Different Degradation Temperatures of a-Si/µc-Si Solar Cells. Presented at the European Photovoltaic Solar Energy Conference and Exhibition, WIP. <a href=\"https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12\">https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12</a>","ama":"Weicht JA, Rasch R, Behrens G, Hamelmann F. Changing of the Parameters of the “three-Diode Model” by Light-Induced Degradation at Different Degradation Temperatures of a-Si/µc-Si Solar Cells. In: WIP; 2015. doi:<a href=\"https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12\">10.4229/EUPVSEC20152015-3CV.1.12</a>","alphadin":"<span style=\"font-variant:small-caps;\">Weicht, J.A.</span> ; <span style=\"font-variant:small-caps;\">Rasch, Robin</span> ; <span style=\"font-variant:small-caps;\">Behrens, Grit</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span>: Changing of the Parameters of the “three-Diode Model” by Light-Induced Degradation at Different Degradation Temperatures of a-Si/µc-Si Solar Cells. In:  : WIP, 2015","chicago":"Weicht, J.A., Robin Rasch, Grit Behrens, and Frank Hamelmann. “Changing of the Parameters of the ‘Three-Diode Model’ by Light-Induced Degradation at Different Degradation Temperatures of a-Si/Μc-Si Solar Cells.” WIP, 2015. <a href=\"https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12\">https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12</a>.","mla":"Weicht, J. A., et al. <i>Changing of the Parameters of the “Three-Diode Model” by Light-Induced Degradation at Different Degradation Temperatures of a-Si/Μc-Si Solar Cells</i>. WIP, 2015, doi:<a href=\"https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12\">10.4229/EUPVSEC20152015-3CV.1.12</a>.","short":"J.A. Weicht, R. Rasch, G. Behrens, F. Hamelmann, in: WIP, 2015.","bibtex":"@inproceedings{Weicht_Rasch_Behrens_Hamelmann_2015, title={Changing of the Parameters of the “three-Diode Model” by Light-Induced Degradation at Different Degradation Temperatures of a-Si/µc-Si Solar Cells}, DOI={<a href=\"https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12\">10.4229/EUPVSEC20152015-3CV.1.12</a>}, publisher={WIP}, author={Weicht, J.A. and Rasch, Robin and Behrens, Grit and Hamelmann, Frank}, year={2015} }"},"title":"Changing of the Parameters of the “three-Diode Model” by Light-Induced Degradation at Different Degradation Temperatures of a-Si/µc-Si Solar Cells","publication_status":"published","year":"2015","type":"conference","language":[{"iso":"eng"}],"abstract":[{"lang":"eng","text":"In this paper we observe the behavior of amorphous/microcrystalline (a-Si/μc-Si) tandem silicon-based\r\nsolar cells before and after light-induced degradation. We show a method of extracting the parameters of the “threediode\r\nmodel” during light-induced degradation. The “three-diode model” describes the tandem layout of the\r\namorphous (a-Si) and the microcrystalline (μc-Si) silicon-based thin film solar cells: a-Si is described by the onediode\r\nmodel, the μc-Si by the two-diode model. Both solar cells are connected in series. By this series connection, the\r\nthree-diode model can be used to describe the cell. In our presented work we show the changing of the parameters of\r\neach diode model during the light-induced degradation at different degradation temperatures (30°C, 50°C and 70°C)."}]}