{"doi":"10.4229/EUPVSEC20162016-3DV.1.4","publisher":"WIP","author":[{"first_name":"J.A.","full_name":"Weicht, J.A.","last_name":"Weicht"},{"id":"208487","first_name":"Frank","last_name":"Hamelmann","full_name":"Hamelmann, Frank"},{"id":"207629","orcid":"0009-0009-0247-8204","first_name":"Grit","last_name":"Behrens","full_name":"Behrens, Grit"}],"date_updated":"2024-03-28T09:03:55Z","language":[{"iso":"eng"}],"type":"conference","conference":{"name":"European Photovoltaic Solar Energy Conference and Exhibition"},"abstract":[{"text":"In our work we observe the temperature coefficients before and after light-induced degradation of\r\namorphous/micro-crystalline (a-Si/μc-Si) tandem silicon-based solar cells. We show that during light-induced\r\ndegradation the temperature parameters of the serial and parallel resistance, photo current and the saturation current in\r\nthe diode model change: the temperature has a stronger effect after the light-induced degradation, the temperaturecoefficient\r\nof silicon-based thin film solar cells varies during the light-induced degradation.","lang":"eng"}],"publication_status":"published","year":"2016","_id":"3514","status":"public","title":"Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/µc-Si Solar Cells","date_created":"2023-09-01T08:47:43Z","citation":{"bibtex":"@inproceedings{Weicht_Hamelmann_Behrens_2016, title={Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/µc-Si Solar Cells}, DOI={<a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">10.4229/EUPVSEC20162016-3DV.1.4</a>}, publisher={WIP}, author={Weicht, J.A. and Hamelmann, Frank and Behrens, Grit}, year={2016} }","ama":"Weicht JA, Hamelmann F, Behrens G. Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/µc-Si Solar Cells. In: WIP; 2016. doi:<a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">10.4229/EUPVSEC20162016-3DV.1.4</a>","mla":"Weicht, J. A., et al. <i>Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells</i>. WIP, 2016, doi:<a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">10.4229/EUPVSEC20162016-3DV.1.4</a>.","short":"J.A. Weicht, F. Hamelmann, G. Behrens, in: WIP, 2016.","alphadin":"<span style=\"font-variant:small-caps;\">Weicht, J.A.</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Behrens, Grit</span>: Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/µc-Si Solar Cells. In:  : WIP, 2016","ieee":"J. A. Weicht, F. Hamelmann, and G. Behrens, “Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/µc-Si Solar Cells,” presented at the European Photovoltaic Solar Energy Conference and Exhibition, 2016.","apa":"Weicht, J. A., Hamelmann, F., &#38; Behrens, G. (2016). Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/µc-Si Solar Cells. Presented at the European Photovoltaic Solar Energy Conference and Exhibition, WIP. <a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4</a>","chicago":"Weicht, J.A., Frank Hamelmann, and Grit Behrens. “Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells.” WIP, 2016. <a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4</a>."},"user_id":"237837"}