Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/µc-Si Solar Cells
J.A. Weicht, F. Hamelmann, G. Behrens, in: WIP, 2016.
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Konferenzbeitrag
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Abstract
In our work we observe the temperature coefficients before and after light-induced degradation of
amorphous/micro-crystalline (a-Si/μc-Si) tandem silicon-based solar cells. We show that during light-induced
degradation the temperature parameters of the serial and parallel resistance, photo current and the saturation current in
the diode model change: the temperature has a stronger effect after the light-induced degradation, the temperaturecoefficient
of silicon-based thin film solar cells varies during the light-induced degradation.
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Konferenz
European Photovoltaic Solar Energy Conference and Exhibition
FH-PUB-ID
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Weicht, J.A. ; Hamelmann, Frank ; Behrens, Grit: Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/µc-Si Solar Cells. In: : WIP, 2016
Weicht JA, Hamelmann F, Behrens G. Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/µc-Si Solar Cells. In: WIP; 2016. doi:10.4229/EUPVSEC20162016-3DV.1.4
Weicht, J. A., Hamelmann, F., & Behrens, G. (2016). Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/µc-Si Solar Cells. Presented at the European Photovoltaic Solar Energy Conference and Exhibition, WIP. https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4
@inproceedings{Weicht_Hamelmann_Behrens_2016, title={Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/µc-Si Solar Cells}, DOI={10.4229/EUPVSEC20162016-3DV.1.4}, publisher={WIP}, author={Weicht, J.A. and Hamelmann, Frank and Behrens, Grit}, year={2016} }
Weicht, J.A., Frank Hamelmann, and Grit Behrens. “Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells.” WIP, 2016. https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4.
J. A. Weicht, F. Hamelmann, and G. Behrens, “Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/µc-Si Solar Cells,” presented at the European Photovoltaic Solar Energy Conference and Exhibition, 2016.
Weicht, J. A., et al. Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells. WIP, 2016, doi:10.4229/EUPVSEC20162016-3DV.1.4.
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