Measurements and calculation of effects on the electrical field due to the limited size of an open area test site
S. Battermann, H. Garbe, in: A.P.J. van Deursen, P.A.A.. Wouters, S. Kapora (Eds.), International Symposium on Electromagnetic Compatibility, EMC Europe 2004, Technische Universiteit Eindhoven, Eindhoven, 2004, pp. 116–120.
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Konferenzbeitrag
| Veröffentlicht
| Englisch
Autor*in
Battermann, Sven
;
Garbe, Heyno
;
Garbe, HeynoHerausgeber*in
van Deursen, A.P.J.;
Wouters, P.A.A.F;
Kapora, S.
Einrichtung
Erscheinungsjahr
Titel des Konferenzbandes
International Symposium on Electromagnetic Compatibility, EMC Europe 2004
Band
1
Seite
116-120
Konferenz
EMC Europe 2004
Konferenzort
Einhoven
Konferenzdatum
2004-09-06 – 2004-09-10
FH-PUB-ID
Zitieren
Battermann, Sven ; Garbe, Heyno: Measurements and calculation of effects on the electrical field due to the limited size of an open area test site. In: van Deursen, A. P. J. ; Wouters, P. A. A. . ; Kapora, S. (Hrsg.): International Symposium on Electromagnetic Compatibility, EMC Europe 2004. Bd. 1. Eindhoven : Technische Universiteit Eindhoven, 2004, S. 116–120
Battermann S, Garbe H. Measurements and calculation of effects on the electrical field due to the limited size of an open area test site. In: van Deursen APJ, Wouters PAA., Kapora S, eds. International Symposium on Electromagnetic Compatibility, EMC Europe 2004. Vol 1. Eindhoven: Technische Universiteit Eindhoven; 2004:116-120.
Battermann, S., & Garbe, H. (2004). Measurements and calculation of effects on the electrical field due to the limited size of an open area test site. In A. P. J. van Deursen, P. A. A. . Wouters, & S. Kapora (Eds.), International Symposium on Electromagnetic Compatibility, EMC Europe 2004 (Vol. 1, pp. 116–120). Eindhoven: Technische Universiteit Eindhoven.
@inproceedings{Battermann_Garbe_2004, place={Eindhoven}, title={Measurements and calculation of effects on the electrical field due to the limited size of an open area test site}, volume={1}, booktitle={International Symposium on Electromagnetic Compatibility, EMC Europe 2004}, publisher={Technische Universiteit Eindhoven}, author={Battermann, Sven and Garbe, Heyno}, editor={van Deursen, A.P.J. and Wouters, P.A.A.F and Kapora, S.Editors}, year={2004}, pages={116–120} }
Battermann, Sven, and Heyno Garbe. “Measurements and Calculation of Effects on the Electrical Field Due to the Limited Size of an Open Area Test Site.” In International Symposium on Electromagnetic Compatibility, EMC Europe 2004, edited by A.P.J. van Deursen, P.A.A.F Wouters, and S. Kapora, 1:116–20. Eindhoven: Technische Universiteit Eindhoven, 2004.
S. Battermann and H. Garbe, “Measurements and calculation of effects on the electrical field due to the limited size of an open area test site,” in International Symposium on Electromagnetic Compatibility, EMC Europe 2004, Einhoven, 2004, vol. 1, pp. 116–120.
Battermann, Sven, and Heyno Garbe. “Measurements and Calculation of Effects on the Electrical Field Due to the Limited Size of an Open Area Test Site.” International Symposium on Electromagnetic Compatibility, EMC Europe 2004, edited by A.P.J. van Deursen et al., vol. 1, Technische Universiteit Eindhoven, 2004, pp. 116–20.
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