{"author":[{"full_name":"Zhang, Jingwei","last_name":"Zhang","first_name":"Jingwei"},{"last_name":"Feng","full_name":"Feng, Li","id":"237630","first_name":"Li"},{"first_name":"Ding","full_name":"Kun, Ding","last_name":"Kun"},{"orcid":"0000-0001-6141-9874","first_name":"Frank","id":"208487","full_name":"Hamelmann, Frank","last_name":"Hamelmann"},{"first_name":"Xihui","last_name":"Chen","full_name":"Chen, Xihui"},{"last_name":"Chen","full_name":"Chen, Xiang","first_name":"Xiang"},{"full_name":"Chen, Ling","last_name":"Chen","first_name":"Ling"}],"publisher":"IEEE","doi":"10.1109/ICIEA51954.2021.9516437","conference":{"location":"Chengdu, China","name":"2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)"},"publication_identifier":{"eisbn":["978-1-6654-2248-2"]},"type":"conference","language":[{"iso":"eng"}],"page":"783-787","date_updated":"2023-08-29T18:39:53Z","year":"2021","publication_status":"published","citation":{"bibtex":"@inproceedings{Zhang_Feng_Kun_Hamelmann_Chen_Chen_Chen_2021, title={Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters}, DOI={<a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">10.1109/ICIEA51954.2021.9516437</a>}, booktitle={2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)}, publisher={IEEE}, author={Zhang, Jingwei and Feng, Li and Kun, Ding and Hamelmann, Frank and Chen, Xihui and Chen, Xiang and Chen, Ling}, year={2021}, pages={783–787} }","mla":"Zhang, Jingwei, et al. “Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters.” <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i>, IEEE, 2021, pp. 783–87, doi:<a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">10.1109/ICIEA51954.2021.9516437</a>.","ama":"Zhang J, Feng L, Kun D, et al. Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters. In: <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i>. IEEE; 2021:783-787. doi:<a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">10.1109/ICIEA51954.2021.9516437</a>","chicago":"Zhang, Jingwei, Li Feng, Ding Kun, Frank Hamelmann, Xihui Chen, Xiang Chen, and Ling Chen. “Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters.” In <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i>, 783–87. IEEE, 2021. <a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">https://doi.org/10.1109/ICIEA51954.2021.9516437</a>.","apa":"Zhang, J., Feng, L., Kun, D., Hamelmann, F., Chen, X., Chen, X., &#38; Chen, L. (2021). Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters. In <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i> (pp. 783–787). Chengdu, China: IEEE. <a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">https://doi.org/10.1109/ICIEA51954.2021.9516437</a>","ieee":"J. Zhang <i>et al.</i>, “Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters,” in <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i>, Chengdu, China, 2021, pp. 783–787.","short":"J. Zhang, L. Feng, D. Kun, F. Hamelmann, X. Chen, X. Chen, L. Chen, in: 2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA), IEEE, 2021, pp. 783–787.","alphadin":"<span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Kun, Ding</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Chen, Xihui</span> ; <span style=\"font-variant:small-caps;\">Chen, Xiang</span> ; <span style=\"font-variant:small-caps;\">Chen, Ling</span>: Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters. In: <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i> : IEEE, 2021, S. 783–787"},"user_id":"245590","publication":"2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)","title":"Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters","date_created":"2023-05-12T15:26:12Z","status":"public","_id":"2918"}