{"type":"journal_article","publication_identifier":{"issn":["0003-6951"],"eissn":["1077-3118"]},"date_updated":"2023-03-26T19:41:51Z","page":"3439-3441","department":[{"_id":"103"}],"language":[{"iso":"eng"}],"intvolume":"        78","publisher":"AIP Publishing","author":[{"last_name":"Schleiwies","full_name":"Schleiwies, J.","first_name":"J."},{"first_name":"G.","last_name":"Schmitz","full_name":"Schmitz, G."},{"last_name":"Heitmann","full_name":"Heitmann, Sonja","id":"202389","orcid":"0000-0002-5503-2128","first_name":"Sonja"},{"first_name":"A.","full_name":"Hütten, A.","last_name":"Hütten"}],"extern":"1","issue":"22","volume":78,"doi":"10.1063/1.1374999","quality_controlled":"1","research_group":[{"name":"Bielefelder Institut für Angewandte Materialforschung (BIfAM)","_id":"af778127-b366-11ed-bde2-daed2b8eafee"}],"publication":"Applied Physics Letters","title":"Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe","date_created":"2023-03-24T13:12:58Z","user_id":"202389","citation":{"alphadin":"<span style=\"font-variant:small-caps;\">Schleiwies, J.</span> ; <span style=\"font-variant:small-caps;\">Schmitz, G.</span> ; <span style=\"font-variant:small-caps;\">Heitmann, Sonja</span> ; <span style=\"font-variant:small-caps;\">Hütten, A.</span>: Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe. In: <i>Applied Physics Letters</i> Bd. 78, AIP Publishing (2001), Nr. 22, S. 3439–3441","short":"J. Schleiwies, G. Schmitz, S. Heitmann, A. Hütten, Applied Physics Letters 78 (2001) 3439–3441.","chicago":"Schleiwies, J., G. Schmitz, Sonja Heitmann, and A. Hütten. “Nanoanalysis of Co/Cu/NiFe Thin Films by Tomographic Atom Probe.” <i>Applied Physics Letters</i> 78, no. 22 (2001): 3439–41. <a href=\"https://doi.org/10.1063/1.1374999\">https://doi.org/10.1063/1.1374999</a>.","apa":"Schleiwies, J., Schmitz, G., Heitmann, S., &#38; Hütten, A. (2001). Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe. <i>Applied Physics Letters</i>, <i>78</i>(22), 3439–3441. <a href=\"https://doi.org/10.1063/1.1374999\">https://doi.org/10.1063/1.1374999</a>","ieee":"J. Schleiwies, G. Schmitz, S. Heitmann, and A. Hütten, “Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe,” <i>Applied Physics Letters</i>, vol. 78, no. 22, pp. 3439–3441, 2001.","ama":"Schleiwies J, Schmitz G, Heitmann S, Hütten A. Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe. <i>Applied Physics Letters</i>. 2001;78(22):3439-3441. doi:<a href=\"https://doi.org/10.1063/1.1374999\">10.1063/1.1374999</a>","mla":"Schleiwies, J., et al. “Nanoanalysis of Co/Cu/NiFe Thin Films by Tomographic Atom Probe.” <i>Applied Physics Letters</i>, vol. 78, no. 22, AIP Publishing, 2001, pp. 3439–41, doi:<a href=\"https://doi.org/10.1063/1.1374999\">10.1063/1.1374999</a>.","bibtex":"@article{Schleiwies_Schmitz_Heitmann_Hütten_2001, title={Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe}, volume={78}, DOI={<a href=\"https://doi.org/10.1063/1.1374999\">10.1063/1.1374999</a>}, number={22}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Schleiwies, J. and Schmitz, G. and Heitmann, Sonja and Hütten, A.}, year={2001}, pages={3439–3441} }"},"_id":"2683","status":"public","publication_status":"published","year":"2001"}