Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe
J. Schleiwies, G. Schmitz, S. Heitmann, A. Hütten, Applied Physics Letters 78 (2001) 3439–3441.
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Artikel
| Veröffentlicht
| Englisch
Autor*in
Schleiwies, J.;
Schmitz, G.;
Heitmann, Sonja
;
Hütten, A.
;
Hütten, A.Forschungsgruppe
Bielefelder Institut für Angewandte Materialforschung (BIfAM)
Erscheinungsjahr
Zeitschriftentitel
Applied Physics Letters
Band
78
Zeitschriftennummer
22
Seite
3439-3441
ISSN
eISSN
FH-PUB-ID
Zitieren
Schleiwies, J. ; Schmitz, G. ; Heitmann, Sonja ; Hütten, A.: Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe. In: Applied Physics Letters Bd. 78, AIP Publishing (2001), Nr. 22, S. 3439–3441
Schleiwies J, Schmitz G, Heitmann S, Hütten A. Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe. Applied Physics Letters. 2001;78(22):3439-3441. doi:10.1063/1.1374999
Schleiwies, J., Schmitz, G., Heitmann, S., & Hütten, A. (2001). Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe. Applied Physics Letters, 78(22), 3439–3441. https://doi.org/10.1063/1.1374999
@article{Schleiwies_Schmitz_Heitmann_Hütten_2001, title={Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe}, volume={78}, DOI={10.1063/1.1374999}, number={22}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Schleiwies, J. and Schmitz, G. and Heitmann, Sonja and Hütten, A.}, year={2001}, pages={3439–3441} }
Schleiwies, J., G. Schmitz, Sonja Heitmann, and A. Hütten. “Nanoanalysis of Co/Cu/NiFe Thin Films by Tomographic Atom Probe.” Applied Physics Letters 78, no. 22 (2001): 3439–41. https://doi.org/10.1063/1.1374999.
J. Schleiwies, G. Schmitz, S. Heitmann, and A. Hütten, “Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe,” Applied Physics Letters, vol. 78, no. 22, pp. 3439–3441, 2001.
Schleiwies, J., et al. “Nanoanalysis of Co/Cu/NiFe Thin Films by Tomographic Atom Probe.” Applied Physics Letters, vol. 78, no. 22, AIP Publishing, 2001, pp. 3439–41, doi:10.1063/1.1374999.
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