{"publication":"Book of Abstracts EUROEM 2004","title":"Time Domain Measurements to Validate Test Site Characteristics","date_created":"2023-02-12T22:02:48Z","user_id":"219522","citation":{"ama":"Battermann S, Garbe H. Time Domain Measurements to Validate Test Site Characteristics. In: Nitsch J, Wollenberg G, Styczynski ZA, et al., eds. <i>Book of Abstracts EUROEM 2004</i>. Vol 1. Magdeburg: Institute for Fundamental Electrical Engineering and Electromagnetic Compatibility; 2004:168.","mla":"Battermann, Sven, and Heyno Garbe. “Time Domain Measurements to Validate Test Site Characteristics.” <i>Book of Abstracts EUROEM 2004</i>, edited by J. Nitsch et al., vol. 1, no. 1, Institute for Fundamental Electrical Engineering and Electromagnetic Compatibility, 2004, p. 168.","bibtex":"@inproceedings{Battermann_Garbe_2004, place={Magdeburg}, title={Time Domain Measurements to Validate Test Site Characteristics}, volume={1}, number={1}, booktitle={Book of Abstracts EUROEM 2004}, publisher={Institute for Fundamental Electrical Engineering and Electromagnetic Compatibility}, author={Battermann, Sven and Garbe, Heyno}, editor={Nitsch, J. and Wollenberg, G. and Styczynski, Z. A.  and Haase, H. and Steinmetz, T. and Nitsch, D. and Sabath, F.Editors}, year={2004}, pages={168} }","ieee":"S. Battermann and H. Garbe, “Time Domain Measurements to Validate Test Site Characteristics,” in <i>Book of Abstracts EUROEM 2004</i>, Magdeburg, 2004, vol. 1, no. 1, p. 168.","apa":"Battermann, S., &#38; Garbe, H. (2004). Time Domain Measurements to Validate Test Site Characteristics. In J. Nitsch, G. Wollenberg, Z. A. Styczynski, H. Haase, T. Steinmetz, D. Nitsch, &#38; F. Sabath (Eds.), <i>Book of Abstracts EUROEM 2004</i> (Vol. 1, p. 168). Magdeburg: Institute for Fundamental Electrical Engineering and Electromagnetic Compatibility.","chicago":"Battermann, Sven, and Heyno Garbe. “Time Domain Measurements to Validate Test Site Characteristics.” In <i>Book of Abstracts EUROEM 2004</i>, edited by J. Nitsch, G. Wollenberg, Z. A.  Styczynski, H. Haase, T. Steinmetz, D. Nitsch, and F. Sabath, 1:168. Magdeburg: Institute for Fundamental Electrical Engineering and Electromagnetic Compatibility, 2004.","alphadin":"<span style=\"font-variant:small-caps;\">Battermann, Sven</span> ; <span style=\"font-variant:small-caps;\">Garbe, Heyno</span>: Time Domain Measurements to Validate Test Site Characteristics. In: <span style=\"font-variant:small-caps;\">Nitsch, J.</span> ; <span style=\"font-variant:small-caps;\">Wollenberg, G.</span> ; <span style=\"font-variant:small-caps;\">Styczynski, Z. A.</span> ; <span style=\"font-variant:small-caps;\">Haase, H.</span> ; <span style=\"font-variant:small-caps;\">Steinmetz, T.</span> ; <span style=\"font-variant:small-caps;\">Nitsch, D.</span> ; <span style=\"font-variant:small-caps;\">Sabath, F.</span> (Hrsg.): <i>Book of Abstracts EUROEM 2004</i>. Bd. 1. Magdeburg : Institute for Fundamental Electrical Engineering and Electromagnetic Compatibility, 2004, S. 168","short":"S. Battermann, H. Garbe, in: J. Nitsch, G. Wollenberg, Z.A. Styczynski, H. Haase, T. Steinmetz, D. Nitsch, F. Sabath (Eds.), Book of Abstracts EUROEM 2004, Institute for Fundamental Electrical Engineering and Electromagnetic Compatibility, Magdeburg, 2004, p. 168."},"_id":"2409","status":"public","publication_status":"published","year":"2004","main_file_link":[{"url":"http://ece-research.unm.edu/summa/notes/AMEREM-EUROEM/Book%20Of%20Abstracts%20EUROEM2004.pdf"}],"type":"conference","publication_identifier":{"isbn":["3-929757-73-7"]},"conference":{"name":"EUROEM 2004 - Euro Electromagnetics","location":"Magdeburg","start_date":"2004-07-12","end_date":"2004-07-16"},"place":"Magdeburg","page":"168","date_updated":"2023-02-12T22:03:04Z","department":[{"_id":"102"}],"language":[{"iso":"eng"}],"intvolume":"         1","editor":[{"full_name":"Nitsch, J.","last_name":"Nitsch","first_name":"J."},{"last_name":"Wollenberg","full_name":"Wollenberg, G.","first_name":"G."},{"full_name":"Styczynski, Z. A. ","last_name":"Styczynski","first_name":"Z. A. "},{"full_name":"Haase, H.","last_name":"Haase","first_name":"H."},{"full_name":"Steinmetz, T.","last_name":"Steinmetz","first_name":"T."},{"full_name":"Nitsch, D.","last_name":"Nitsch","first_name":"D."},{"full_name":"Sabath, F.","last_name":"Sabath","first_name":"F."}],"publisher":"Institute for Fundamental Electrical Engineering and Electromagnetic Compatibility","extern":"1","issue":"1","author":[{"full_name":"Battermann, Sven","last_name":"Battermann","orcid":"0000-0001-7203-7396","first_name":"Sven","id":"219522"},{"full_name":"Garbe, Heyno","last_name":"Garbe","first_name":"Heyno"}],"volume":1}