{"page":"418-425","doi":"10.5220/0011727900003411","citation":{"apa":"Viertel, P., König, M., &#38; Rexilius, J. (2023). Metric-Based Few-Shot Learning for Pollen Grain Image Classification. In <i>Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM</i> (pp. 418–425). Lisbon, Portugal. <a href=\"https://doi.org/10.5220/0011727900003411\">https://doi.org/10.5220/0011727900003411</a>","chicago":"Viertel, Philipp, Matthias König, and Jan Rexilius. “Metric-Based Few-Shot Learning for Pollen Grain Image Classification.” In <i>Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM</i>, 418–25, 2023. <a href=\"https://doi.org/10.5220/0011727900003411\">https://doi.org/10.5220/0011727900003411</a>.","ieee":"P. Viertel, M. König, and J. Rexilius, “Metric-Based Few-Shot Learning for Pollen Grain Image Classification,” in <i>Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM</i>, Lisbon, Portugal, 2023, pp. 418–425.","mla":"Viertel, Philipp, et al. “Metric-Based Few-Shot Learning for Pollen Grain Image Classification.” <i>Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM</i>, 2023, pp. 418–25, doi:<a href=\"https://doi.org/10.5220/0011727900003411\">10.5220/0011727900003411</a>.","ama":"Viertel P, König M, Rexilius J. Metric-Based Few-Shot Learning for Pollen Grain Image Classification. In: <i>Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM</i>. ; 2023:418-425. doi:<a href=\"https://doi.org/10.5220/0011727900003411\">10.5220/0011727900003411</a>","bibtex":"@inproceedings{Viertel_König_Rexilius_2023, title={Metric-Based Few-Shot Learning for Pollen Grain Image Classification}, DOI={<a href=\"https://doi.org/10.5220/0011727900003411\">10.5220/0011727900003411</a>}, booktitle={Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM}, author={Viertel, Philipp and König, Matthias and Rexilius, Jan}, year={2023}, pages={418–425} }","short":"P. Viertel, M. König, J. Rexilius, in: Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM, 2023, pp. 418–425.","alphadin":"<span style=\"font-variant:small-caps;\">Viertel, Philipp</span> ; <span style=\"font-variant:small-caps;\">König, Matthias</span> ; <span style=\"font-variant:small-caps;\">Rexilius, Jan</span>: Metric-Based Few-Shot Learning for Pollen Grain Image Classification. In: <i>Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM</i>, 2023, S. 418–425"},"date_created":"2023-01-09T09:05:03Z","date_updated":"2023-03-06T08:27:32Z","publication_status":"published","language":[{"iso":"eng"}],"publication_identifier":{"isbn":["978-989-758-626-2"]},"department":[{"_id":"102"}],"user_id":"216274","publication":"Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM","type":"conference","year":"2023","author":[{"first_name":"Philipp","last_name":"Viertel","id":"216274","full_name":"Viertel, Philipp","orcid":"0000-0002-7274-4290"},{"first_name":"Matthias","last_name":"König","orcid":"0000-0002-4915-0750","full_name":"König, Matthias","id":"213498"},{"first_name":"Jan","last_name":"Rexilius","full_name":"Rexilius, Jan","id":"245736","orcid":"0000-0002-4579-214X"}],"title":"Metric-Based Few-Shot Learning for Pollen Grain Image Classification","status":"public","conference":{"start_date":"22.02.2023","end_date":"24.02.2023","location":"Lisbon, Portugal"},"_id":"2292"}