Metric-Based Few-Shot Learning for Pollen Grain Image Classification
P. Viertel, M. König, J. Rexilius, in: Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM, 2023, pp. 418–425.
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Konferenzbeitrag
| Veröffentlicht
| Englisch
Autor*in
Einrichtung
Erscheinungsjahr
Titel des Konferenzbandes
Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM
Seite
418-425
Konferenzort
Lisbon, Portugal
Konferenzdatum
22.02.2023 – 24.02.2023
ISBN
FH-PUB-ID
Zitieren
Viertel, Philipp ; König, Matthias ; Rexilius, Jan: Metric-Based Few-Shot Learning for Pollen Grain Image Classification. In: Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM, 2023, S. 418–425
Viertel P, König M, Rexilius J. Metric-Based Few-Shot Learning for Pollen Grain Image Classification. In: Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM. ; 2023:418-425. doi:10.5220/0011727900003411
Viertel, P., König, M., & Rexilius, J. (2023). Metric-Based Few-Shot Learning for Pollen Grain Image Classification. In Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM (pp. 418–425). Lisbon, Portugal. https://doi.org/10.5220/0011727900003411
@inproceedings{Viertel_König_Rexilius_2023, title={Metric-Based Few-Shot Learning for Pollen Grain Image Classification}, DOI={10.5220/0011727900003411}, booktitle={Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM}, author={Viertel, Philipp and König, Matthias and Rexilius, Jan}, year={2023}, pages={418–425} }
Viertel, Philipp, Matthias König, and Jan Rexilius. “Metric-Based Few-Shot Learning for Pollen Grain Image Classification.” In Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM, 418–25, 2023. https://doi.org/10.5220/0011727900003411.
P. Viertel, M. König, and J. Rexilius, “Metric-Based Few-Shot Learning for Pollen Grain Image Classification,” in Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM, Lisbon, Portugal, 2023, pp. 418–425.
Viertel, Philipp, et al. “Metric-Based Few-Shot Learning for Pollen Grain Image Classification.” Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM, 2023, pp. 418–25, doi:10.5220/0011727900003411.
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