{"quality_controlled":"1","volume":2,"doi":"10.1049/iet-smt:20070056","author":[{"id":"219522","first_name":"Sven","orcid":"0000-0001-7203-7396","last_name":"Battermann","full_name":"Battermann, Sven"},{"last_name":"Silva","full_name":"Silva, F.","first_name":"F."},{"full_name":"Garbe, H.","last_name":"Garbe","first_name":"H."},{"last_name":"Pous","full_name":"Pous, M.","first_name":"M."},{"last_name":"Marvin","full_name":"Marvin, A.C.","first_name":"A.C."},{"last_name":"Degardin","full_name":"Degardin, V.","first_name":"V."},{"first_name":"D.W.","last_name":"Welsh","full_name":"Welsh, D.W."},{"last_name":"Newbury","full_name":"Newbury, J.","first_name":"J."},{"first_name":"A.D.","last_name":"Papatsoris","full_name":"Papatsoris, A.D."},{"first_name":"J.","full_name":"Catrysse, J.","last_name":"Catrysse"},{"last_name":"Flintoft","full_name":"Flintoft, I.D.","first_name":"I.D."},{"first_name":"K.","full_name":"Vantomme, K.","last_name":"Vantomme"},{"full_name":"Degauque, P.","last_name":"Degauque","first_name":"P."},{"first_name":"V.","full_name":"Beauvois, V.","last_name":"Beauvois"},{"full_name":"Liénard, M.","last_name":"Liénard","first_name":"M."}],"extern":"1","issue":"3","publisher":"Institution of Engineering and Technology (IET)","intvolume":"         2","language":[{"iso":"eng"}],"page":"154-159","date_updated":"2023-05-30T21:09:56Z","publication_identifier":{"issn":["1751-8822"],"eissn":["1751-8830"]},"type":"journal_article","year":"2008","publication_status":"published","status":"public","_id":"2129","citation":{"short":"S. Battermann, F. Silva, H. Garbe, M. Pous, A.C. Marvin, V. Degardin, D.W. Welsh, J. Newbury, A.D. Papatsoris, J. Catrysse, I.D. Flintoft, K. Vantomme, P. Degauque, V. Beauvois, M. Liénard, IET Science, Measurement &#38; Technology 2 (2008) 154–159.","alphadin":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Battermann, Sven</span> ; <span style=\"font-variant:small-caps;\">Silva, F.</span> ; <span style=\"font-variant:small-caps;\">Garbe, H.</span> ; <span style=\"font-variant:small-caps;\">Pous, M.</span> ; <span style=\"font-variant:small-caps;\">Marvin, A.C.</span> ; <span style=\"font-variant:small-caps;\">Degardin, V.</span> ; <span style=\"font-variant:small-caps;\">Welsh, D.W.</span> ; <span style=\"font-variant:small-caps;\">Newbury, J.</span> ; u. a.</span>: Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 2. In: <i>IET Science, Measurement &#38; Technology</i> Bd. 2, Institution of Engineering and Technology (IET) (2008), Nr. 3, S. 154–159","chicago":"Battermann, Sven, F. Silva, H. Garbe, M. Pous, A.C. Marvin, V. Degardin, D.W. Welsh, et al. “Electromagnetic Compatibility Analysis of Unstructured Mains Networks for High-Speed Data Transmission: Part 2.” <i>IET Science, Measurement &#38; Technology</i> 2, no. 3 (2008): 154–59. <a href=\"https://doi.org/10.1049/iet-smt:20070056\">https://doi.org/10.1049/iet-smt:20070056</a>.","apa":"Battermann, S., Silva, F., Garbe, H., Pous, M., Marvin, A. C., Degardin, V., … Liénard, M. (2008). Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 2. <i>IET Science, Measurement &#38; Technology</i>, <i>2</i>(3), 154–159. <a href=\"https://doi.org/10.1049/iet-smt:20070056\">https://doi.org/10.1049/iet-smt:20070056</a>","ieee":"S. Battermann <i>et al.</i>, “Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 2,” <i>IET Science, Measurement &#38; Technology</i>, vol. 2, no. 3, pp. 154–159, 2008.","bibtex":"@article{Battermann_Silva_Garbe_Pous_Marvin_Degardin_Welsh_Newbury_Papatsoris_Catrysse_et al._2008, title={Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 2}, volume={2}, DOI={<a href=\"https://doi.org/10.1049/iet-smt:20070056\">10.1049/iet-smt:20070056</a>}, number={3}, journal={IET Science, Measurement &#38; Technology}, publisher={Institution of Engineering and Technology (IET)}, author={Battermann, Sven and Silva, F. and Garbe, H. and Pous, M. and Marvin, A.C. and Degardin, V. and Welsh, D.W. and Newbury, J. and Papatsoris, A.D. and Catrysse, J. and et al.}, year={2008}, pages={154–159} }","ama":"Battermann S, Silva F, Garbe H, et al. Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 2. <i>IET Science, Measurement &#38; Technology</i>. 2008;2(3):154-159. doi:<a href=\"https://doi.org/10.1049/iet-smt:20070056\">10.1049/iet-smt:20070056</a>","mla":"Battermann, Sven, et al. “Electromagnetic Compatibility Analysis of Unstructured Mains Networks for High-Speed Data Transmission: Part 2.” <i>IET Science, Measurement &#38; Technology</i>, vol. 2, no. 3, Institution of Engineering and Technology (IET), 2008, pp. 154–59, doi:<a href=\"https://doi.org/10.1049/iet-smt:20070056\">10.1049/iet-smt:20070056</a>."},"user_id":"219522","date_created":"2022-09-24T09:06:17Z","title":"Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 2","publication":"IET Science, Measurement & Technology"}