{"type":"journal_article","publication_identifier":{"issn":["1751-8822"],"eissn":["1751-8830"]},"date_updated":"2023-03-16T12:55:42Z","page":"146-153","language":[{"iso":"eng"}],"intvolume":" 2","publisher":"Institution of Engineering and Technology (IET)","author":[{"id":"219522","orcid":"0000-0001-7203-7396","first_name":"Sven","last_name":"Battermann","full_name":"Battermann, Sven"},{"last_name":"Papatsoris","full_name":"Papatsoris, A.D.","first_name":"A.D."},{"last_name":"Beauvois","full_name":"Beauvois, V.","first_name":"V."},{"first_name":"I.D.","last_name":"Flintoft","full_name":"Flintoft, I.D."},{"full_name":"Pous, M.","last_name":"Pous","first_name":"M."},{"last_name":"Degardin","full_name":"Degardin, V.","first_name":"V."},{"first_name":"P.","full_name":"Degauque, P.","last_name":"Degauque"},{"last_name":"Silva","full_name":"Silva, F.","first_name":"F."},{"last_name":"Marvin","full_name":"Marvin, A.C.","first_name":"A.C."},{"full_name":"Newbury, J.","last_name":"Newbury","first_name":"J."},{"full_name":"Liénard, M.","last_name":"Liénard","first_name":"M."},{"first_name":"H.","last_name":"Garbe","full_name":"Garbe, H."},{"full_name":"Catrysse, J.","last_name":"Catrysse","first_name":"J."},{"full_name":"Welsh, D.W.","last_name":"Welsh","first_name":"D.W."},{"first_name":"K.","full_name":"Vantomme, K.","last_name":"Vantomme"}],"extern":"1","issue":"3","volume":2,"doi":"10.1049/iet-smt:20070055","quality_controlled":"1","title":"Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 1","date_created":"2022-09-24T09:06:15Z","publication":"IET Science, Measurement & Technology","citation":{"alphadin":"Battermann, Sven ; Papatsoris, A.D. ; Beauvois, V. ; Flintoft, I.D. ; Pous, M. ; Degardin, V. ; Degauque, P. ; Silva, F. ; u. a.: Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 1. In: IET Science, Measurement & Technology Bd. 2, Institution of Engineering and Technology (IET) (2008), Nr. 3, S. 146–153","short":"S. Battermann, A.D. Papatsoris, V. Beauvois, I.D. Flintoft, M. Pous, V. Degardin, P. Degauque, F. Silva, A.C. Marvin, J. Newbury, M. Liénard, H. Garbe, J. Catrysse, D.W. Welsh, K. Vantomme, IET Science, Measurement & Technology 2 (2008) 146–153.","ieee":"S. Battermann et al., “Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 1,” IET Science, Measurement & Technology, vol. 2, no. 3, pp. 146–153, 2008.","apa":"Battermann, S., Papatsoris, A. D., Beauvois, V., Flintoft, I. D., Pous, M., Degardin, V., … Vantomme, K. (2008). Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 1. IET Science, Measurement & Technology, 2(3), 146–153. https://doi.org/10.1049/iet-smt:20070055","chicago":"Battermann, Sven, A.D. Papatsoris, V. Beauvois, I.D. Flintoft, M. Pous, V. Degardin, P. Degauque, et al. “Electromagnetic Compatibility Analysis of Unstructured Mains Networks for High-Speed Data Transmission: Part 1.” IET Science, Measurement & Technology 2, no. 3 (2008): 146–53. https://doi.org/10.1049/iet-smt:20070055.","mla":"Battermann, Sven, et al. “Electromagnetic Compatibility Analysis of Unstructured Mains Networks for High-Speed Data Transmission: Part 1.” IET Science, Measurement & Technology, vol. 2, no. 3, Institution of Engineering and Technology (IET), 2008, pp. 146–53, doi:10.1049/iet-smt:20070055.","ama":"Battermann S, Papatsoris AD, Beauvois V, et al. Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 1. IET Science, Measurement & Technology. 2008;2(3):146-153. doi:10.1049/iet-smt:20070055","bibtex":"@article{Battermann_Papatsoris_Beauvois_Flintoft_Pous_Degardin_Degauque_Silva_Marvin_Newbury_et al._2008, title={Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 1}, volume={2}, DOI={10.1049/iet-smt:20070055}, number={3}, journal={IET Science, Measurement & Technology}, publisher={Institution of Engineering and Technology (IET)}, author={Battermann, Sven and Papatsoris, A.D. and Beauvois, V. and Flintoft, I.D. and Pous, M. and Degardin, V. and Degauque, P. and Silva, F. and Marvin, A.C. and Newbury, J. and et al.}, year={2008}, pages={146–153} }"},"user_id":"245590","_id":"2128","status":"public","publication_status":"published","year":"2008"}