{"status":"public","_id":"2126","user_id":"245590","citation":{"ieee":"H. Garbe and S. Battermann, “Converting total-radiated-power measurements to equivalent E-Field Data,” in 2008 IEEE International Symposium on Electromagnetic Compatibility, Detroit, MI, 2008, pp. 1–6.","apa":"Garbe, H., & Battermann, S. (2008). Converting total-radiated-power measurements to equivalent E-Field Data. In 2008 IEEE International Symposium on Electromagnetic Compatibility (pp. 1–6). Detroit, MI: IEEE. https://doi.org/10.1109/ISEMC.2008.4652048","chicago":"Garbe, Heyno, and Sven Battermann. “Converting Total-Radiated-Power Measurements to Equivalent E-Field Data.” In 2008 IEEE International Symposium on Electromagnetic Compatibility, 1–6. IEEE, 2008. https://doi.org/10.1109/ISEMC.2008.4652048.","short":"H. Garbe, S. Battermann, in: 2008 IEEE International Symposium on Electromagnetic Compatibility, IEEE, 2008, pp. 1–6.","alphadin":"Garbe, Heyno ; Battermann, Sven: Converting total-radiated-power measurements to equivalent E-Field Data. In: 2008 IEEE International Symposium on Electromagnetic Compatibility : IEEE, 2008, S. 1–6","bibtex":"@inproceedings{Garbe_Battermann_2008, title={Converting total-radiated-power measurements to equivalent E-Field Data}, DOI={10.1109/ISEMC.2008.4652048}, booktitle={2008 IEEE International Symposium on Electromagnetic Compatibility}, publisher={IEEE}, author={Garbe, Heyno and Battermann, Sven}, year={2008}, pages={1–6} }","ama":"Garbe H, Battermann S. Converting total-radiated-power measurements to equivalent E-Field Data. In: 2008 IEEE International Symposium on Electromagnetic Compatibility. IEEE; 2008:1-6. doi:10.1109/ISEMC.2008.4652048","mla":"Garbe, Heyno, and Sven Battermann. “Converting Total-Radiated-Power Measurements to Equivalent E-Field Data.” 2008 IEEE International Symposium on Electromagnetic Compatibility, IEEE, 2008, pp. 1–6, doi:10.1109/ISEMC.2008.4652048."},"publication":"2008 IEEE International Symposium on Electromagnetic Compatibility","title":"Converting total-radiated-power measurements to equivalent E-Field Data","date_created":"2022-09-24T09:06:13Z","year":"2008","publication_status":"published","language":[{"iso":"eng"}],"date_updated":"2022-09-27T12:05:42Z","page":"1-6","conference":{"location":"Detroit, MI","name":"2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008"},"publication_identifier":{"isbn":["978-1-4244-1699-8"]},"type":"conference","doi":"10.1109/ISEMC.2008.4652048","author":[{"full_name":"Garbe, Heyno","last_name":"Garbe","first_name":"Heyno"},{"first_name":"Sven","orcid":"0000-0001-7203-7396","id":"219522","full_name":"Battermann, Sven","last_name":"Battermann"}],"publisher":"IEEE"}