Converting total-radiated-power measurements to equivalent E-Field Data
H. Garbe, S. Battermann, in: 2008 IEEE International Symposium on Electromagnetic Compatibility, IEEE, 2008, pp. 1–6.
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Konferenzbeitrag
| Veröffentlicht
| Englisch
Autor*in
Garbe, Heyno;
Battermann, Sven
Erscheinungsjahr
Titel des Konferenzbandes
2008 IEEE International Symposium on Electromagnetic Compatibility
Seite
1-6
Konferenz
2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008
Konferenzort
Detroit, MI
ISBN
FH-PUB-ID
Zitieren
Garbe, Heyno ; Battermann, Sven: Converting total-radiated-power measurements to equivalent E-Field Data. In: 2008 IEEE International Symposium on Electromagnetic Compatibility : IEEE, 2008, S. 1–6
Garbe H, Battermann S. Converting total-radiated-power measurements to equivalent E-Field Data. In: 2008 IEEE International Symposium on Electromagnetic Compatibility. IEEE; 2008:1-6. doi:10.1109/ISEMC.2008.4652048
Garbe, H., & Battermann, S. (2008). Converting total-radiated-power measurements to equivalent E-Field Data. In 2008 IEEE International Symposium on Electromagnetic Compatibility (pp. 1–6). Detroit, MI: IEEE. https://doi.org/10.1109/ISEMC.2008.4652048
@inproceedings{Garbe_Battermann_2008, title={Converting total-radiated-power measurements to equivalent E-Field Data}, DOI={10.1109/ISEMC.2008.4652048}, booktitle={2008 IEEE International Symposium on Electromagnetic Compatibility}, publisher={IEEE}, author={Garbe, Heyno and Battermann, Sven}, year={2008}, pages={1–6} }
Garbe, Heyno, and Sven Battermann. “Converting Total-Radiated-Power Measurements to Equivalent E-Field Data.” In 2008 IEEE International Symposium on Electromagnetic Compatibility, 1–6. IEEE, 2008. https://doi.org/10.1109/ISEMC.2008.4652048.
H. Garbe and S. Battermann, “Converting total-radiated-power measurements to equivalent E-Field Data,” in 2008 IEEE International Symposium on Electromagnetic Compatibility, Detroit, MI, 2008, pp. 1–6.
Garbe, Heyno, and Sven Battermann. “Converting Total-Radiated-Power Measurements to Equivalent E-Field Data.” 2008 IEEE International Symposium on Electromagnetic Compatibility, IEEE, 2008, pp. 1–6, doi:10.1109/ISEMC.2008.4652048.
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