Measurement and visualization of the radiation patterns of portable electronic devices design of a near field scanner and first measurements
O. Doring, B. Rohrsen, S. Battermann, H. Garbe, T. Stadtler, R. Kebel, in: 2008 International Symposium on Electromagnetic Compatibility - EMC Europe, IEEE, 2008, pp. 1–4.
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Konferenzbeitrag
| Veröffentlicht
| Englisch
Autor*in
Doring, Oliver;
Rohrsen, Bjorn;
Battermann, Sven ;
Garbe, Heyno;
Stadtler, Thiemo;
Kebel, Robert
Erscheinungsjahr
Titel des Konferenzbandes
2008 International Symposium on Electromagnetic Compatibility - EMC Europe
Seite
1-4
Konferenz
2008 International Symposium on Electromagnetic Compatibility - EMC Europe
Konferenzort
Hamburg, Germany
FH-PUB-ID
Zitieren
Doring, Oliver ; Rohrsen, Bjorn ; Battermann, Sven ; Garbe, Heyno ; Stadtler, Thiemo ; Kebel, Robert: Measurement and visualization of the radiation patterns of portable electronic devices design of a near field scanner and first measurements. In: 2008 International Symposium on Electromagnetic Compatibility - EMC Europe : IEEE, 2008, S. 1–4
Doring O, Rohrsen B, Battermann S, Garbe H, Stadtler T, Kebel R. Measurement and visualization of the radiation patterns of portable electronic devices design of a near field scanner and first measurements. In: 2008 International Symposium on Electromagnetic Compatibility - EMC Europe. IEEE; 2008:1-4. doi:10.1109/EMCEUROPE.2008.4786903
Doring, O., Rohrsen, B., Battermann, S., Garbe, H., Stadtler, T., & Kebel, R. (2008). Measurement and visualization of the radiation patterns of portable electronic devices design of a near field scanner and first measurements. In 2008 International Symposium on Electromagnetic Compatibility - EMC Europe (pp. 1–4). Hamburg, Germany: IEEE. https://doi.org/10.1109/EMCEUROPE.2008.4786903
@inproceedings{Doring_Rohrsen_Battermann_Garbe_Stadtler_Kebel_2008, title={Measurement and visualization of the radiation patterns of portable electronic devices design of a near field scanner and first measurements}, DOI={10.1109/EMCEUROPE.2008.4786903}, booktitle={2008 International Symposium on Electromagnetic Compatibility - EMC Europe}, publisher={IEEE}, author={Doring, Oliver and Rohrsen, Bjorn and Battermann, Sven and Garbe, Heyno and Stadtler, Thiemo and Kebel, Robert}, year={2008}, pages={1–4} }
Doring, Oliver, Bjorn Rohrsen, Sven Battermann, Heyno Garbe, Thiemo Stadtler, and Robert Kebel. “Measurement and Visualization of the Radiation Patterns of Portable Electronic Devices Design of a near Field Scanner and First Measurements.” In 2008 International Symposium on Electromagnetic Compatibility - EMC Europe, 1–4. IEEE, 2008. https://doi.org/10.1109/EMCEUROPE.2008.4786903.
O. Doring, B. Rohrsen, S. Battermann, H. Garbe, T. Stadtler, and R. Kebel, “Measurement and visualization of the radiation patterns of portable electronic devices design of a near field scanner and first measurements,” in 2008 International Symposium on Electromagnetic Compatibility - EMC Europe, Hamburg, Germany, 2008, pp. 1–4.
Doring, Oliver, et al. “Measurement and Visualization of the Radiation Patterns of Portable Electronic Devices Design of a near Field Scanner and First Measurements.” 2008 International Symposium on Electromagnetic Compatibility - EMC Europe, IEEE, 2008, pp. 1–4, doi:10.1109/EMCEUROPE.2008.4786903.