{"type":"book_chapter","series_title":"Lecture Notes in Computer Science","publication_identifier":{"issn":["0302-9743"],"isbn":["978-3-319-19065-5"],"eissn":["1611-3349"],"eisbn":["978-3-319-19066-2"]},"department":[{"_id":"4b2dc5c9-bee3-11eb-b75f-ecc80f94fb21"}],"page":"305-315","date_updated":"2023-03-28T11:12:09Z","place":"Cham","language":[{"iso":"eng"}],"publisher":"Springer International Publishing","editor":[{"first_name":"Moonis","last_name":"Ali","full_name":"Ali, Moonis"},{"first_name":"Young Sig","full_name":"Kwon, Young Sig","last_name":"Kwon"},{"first_name":"Chang-Hwan","full_name":"Lee, Chang-Hwan","last_name":"Lee"},{"last_name":"Kim","full_name":"Kim, Juntae","first_name":"Juntae"},{"first_name":"Yongdai","last_name":"Kim","full_name":"Kim, Yongdai"}],"author":[{"first_name":"Michaela","last_name":"Geierhos","full_name":"Geierhos, Michaela"},{"orcid":"0000-0002-0826-0144","first_name":"Frederik","id":"241734","full_name":"Bäumer, Frederik","last_name":"Bäumer"},{"full_name":"Schulze, Sabine","last_name":"Schulze","first_name":"Sabine"},{"full_name":"Stuß, Valentina","last_name":"Stuß","first_name":"Valentina"}],"extern":"1","doi":"10.1007/978-3-319-19066-2_30","date_created":"2022-03-31T08:33:28Z","title":"Filtering Reviews by Random Individual Error","publication":"Current Approaches in Applied Artificial Intelligence","user_id":"241734","citation":{"ama":"Geierhos M, Bäumer F, Schulze S, Stuß V. Filtering Reviews by Random Individual Error. In: Ali M, Kwon YS, Lee C-H, Kim J, Kim Y, eds. Current Approaches in Applied Artificial Intelligence. Lecture Notes in Computer Science. Cham: Springer International Publishing; 2015:305-315. doi:10.1007/978-3-319-19066-2_30","mla":"Geierhos, Michaela, et al. “Filtering Reviews by Random Individual Error.” Current Approaches in Applied Artificial Intelligence, edited by Moonis Ali et al., Springer International Publishing, 2015, pp. 305–15, doi:10.1007/978-3-319-19066-2_30.","bibtex":"@inbook{Geierhos_Bäumer_Schulze_Stuß_2015, place={Cham}, series={Lecture Notes in Computer Science}, title={Filtering Reviews by Random Individual Error}, DOI={10.1007/978-3-319-19066-2_30}, booktitle={Current Approaches in Applied Artificial Intelligence}, publisher={Springer International Publishing}, author={Geierhos, Michaela and Bäumer, Frederik and Schulze, Sabine and Stuß, Valentina}, editor={Ali, Moonis and Kwon, Young Sig and Lee, Chang-Hwan and Kim, Juntae and Kim, YongdaiEditors}, year={2015}, pages={305–315}, collection={Lecture Notes in Computer Science} }","ieee":"M. Geierhos, F. Bäumer, S. Schulze, and V. Stuß, “Filtering Reviews by Random Individual Error,” in Current Approaches in Applied Artificial Intelligence, M. Ali, Y. S. Kwon, C.-H. Lee, J. Kim, and Y. Kim, Eds. Cham: Springer International Publishing, 2015, pp. 305–315.","chicago":"Geierhos, Michaela, Frederik Bäumer, Sabine Schulze, and Valentina Stuß. “Filtering Reviews by Random Individual Error.” In Current Approaches in Applied Artificial Intelligence, edited by Moonis Ali, Young Sig Kwon, Chang-Hwan Lee, Juntae Kim, and Yongdai Kim, 305–15. Lecture Notes in Computer Science. Cham: Springer International Publishing, 2015. https://doi.org/10.1007/978-3-319-19066-2_30.","apa":"Geierhos, M., Bäumer, F., Schulze, S., & Stuß, V. (2015). Filtering Reviews by Random Individual Error. In M. Ali, Y. S. Kwon, C.-H. Lee, J. Kim, & Y. Kim (Eds.), Current Approaches in Applied Artificial Intelligence (pp. 305–315). Cham: Springer International Publishing. https://doi.org/10.1007/978-3-319-19066-2_30","alphadin":"Geierhos, Michaela ; Bäumer, Frederik ; Schulze, Sabine ; Stuß, Valentina: Filtering Reviews by Random Individual Error. In: Ali, M. ; Kwon, Y. S. ; Lee, C.-H. ; Kim, J. ; Kim, Y. (Hrsg.): Current Approaches in Applied Artificial Intelligence, Lecture Notes in Computer Science. Cham : Springer International Publishing, 2015, S. 305–315","short":"M. Geierhos, F. Bäumer, S. Schulze, V. Stuß, in: M. Ali, Y.S. Kwon, C.-H. Lee, J. Kim, Y. Kim (Eds.), Current Approaches in Applied Artificial Intelligence, Springer International Publishing, Cham, 2015, pp. 305–315."},"_id":"1776","status":"public","publication_status":"published","year":"2015"}